% % This file was created by the TYPO3 extension % bib % --- Timezone: CEST % Creation date: 2024-07-04 % Creation time: 05-25-03 % --- Number of references % 2 % @Inproceedings { 2008-sensys-sasnauskas-kleenet, title = {Poster Abstract: KleeNet - Automatic Bug Hunting in Sensor Network Applications}, year = {2008}, month = {11}, pages = {425--426}, abstract = {We present KleeNet, a Klee based bug hunting tool for sensor network applications before deployment. KleeNet automatically tests code for all possible inputs, ensures memory safety, and integrates well into TinyOS based application development life cycle, making it easy for developers to test their applications.}, keywords = {bug finding, memory safety, tinyos, type safety}, tags = {kleenet}, url = {fileadmin/papers/2008/2008-11-Sasnauskas-SenSys08-KleeNet.pdf}, misc2 = {Print}, publisher = {ACM}, address = {New York, NY, USA}, booktitle = {Proceedings of the 6th ACM conference on Embedded network sensor systems (SenSys'08), Raleigh, NC, USA}, language = {en}, ISBN = {978-1-59593-990-6}, DOI = {http://doi.acm.org/10.1145/1460412.1460485}, reviewed = {1}, author = {Sasnauskas, Raimondas and Bitsch Link, J{\'o} Agila and Alizai, Muhammad Hamad and Wehrle, Klaus} } @Techreport { 2008-fgsn-sasnauskas-kleenet, title = {Bug Hunting in Sensor Network Applications}, year = {2008}, month = {9}, abstract = {Testing sensor network applications is an essential and a difficult task. Due to their distributed and faulty nature, severe resource constraints, unobservable interactions, and limited human interaction, sensor networks, make monitoring and debugging of applications strenuous and more challenging. In this paper we present KleeNet - a Klee based platform independent bug hunting tool for sensor network applications before deployment - which can automatically test applications for all possible inputs, and hence, ensures memory safety for TinyOS based applications. Upon finding a bug, KleeNet generates a concrete test case with real input values identifying a specific error path in a program. Additionally, we show that KleeNet integrates well into TinyOS application development life cycle with minimum manual effort, making it easy for developers to test their applications.}, tags = {kleenet}, url = {fileadmin/papers/2008/2008-09-Sasnauskas-FGSN08-BugHunting.pdf}, web_url = {ftp://ftp.inf.fu-berlin.de/pub/reports/tr-b-08-12.pdf}, misc2 = {Print}, publisher = {Freie Universit{\"a}t Berlin, Institute of Computer Science}, address = {Berlin, Germany}, booktitle = {Proceedings of the 7th GI/ITG Fachgespraech Wireless Sensor Networks, Berlin, Germany}, institution = {Chair of Communication and Distributed Systems (ComSys)}, language = {en}, reviewed = {1}, author = {Sasnauskas, Raimondas and Bitsch Link, J{\'o} Agila and Alizai, Muhammad Hamad and Wehrle, Klaus} }